ИССЛЕДОВАНИЕ ПРИЧИН ДЕГРАДАЦИИ МАТЕРИАЛА ДИСКРЕТНЫХ УСТРОЙСТВ ДЛЯ
ОБЕСПЕЧЕНИЯ ИХ НАДЕЖНОСТИ
Кравченко Ольга Витальевна
старший преподаватель
Черкасский технологический университет
г.Черкассы
RESEARCH THE CAUSES OF
DEGRADATION OF THE MATERIAL DISCRETE DEVICES TO ENSURE THEIR RELIABLE
Olga Kravchenko
senior Lecturer
Cherkasy State
Technological University
АННОТАЦИЯ
В статье дано определение надежности и выполнено классификацию отказов дискретных устройств. Долгий жизненный цикл компьютерных систем должны обеспечивать не только функциональные, программные составляющие, так и физическое аппаратное обеспечение. Одним из условий физического обеспечения является надежность дискретных устройств компьютерных систем.
Проведен анализ физики отказов. Концентрация проникающих в материалы веществ и уровень энергетических воздействий зависят от качества защиты элемента от воздействия внешних и внутренних эксплуатационных факторов. Рост интенсивности их воздействия на элемент увеличивает скорость протекания физико-химических процессов, в результате чего возникают обратимые и необратимые изменения в материалах. Физическая природа отказов базируется на практических задачах по определению надежности дискретных устройств. При этом необходимо учитывать причины отказов и построение корректных математических моделей.
Для анализа уровня надежности информационно-расчетных систем разработаны математические модели по теории надежности. Разработано и описано модель отражающая поведение композитного материала дискретного устройства с учетом завершенных физических процессов в самом материале. При анализе систем типа металл-неметалл, металл-металл существует особая область - тонкий слой, имеющий отличные физико - химические свойства от основных составляющих. Этот слой отвечает за прочность контакта и является связующим звеном между фазами материалов. Численная реализация данных задач проводилась в соответствии с разработанным алгоритмом с помощью существующих математических компьютерных программ с некоторыми дополнениями.
ABSTRACT
The article provides a definition of reliability and failure to classify
discrete devices. Long life cycle of computer systems must ensure not only
functional, software components, and the physical hardware. One of the
conditions is to ensure the physical reliability of discrete devices of
computer systems.
The analysis of the physics of failure was made. The
concentration of penetrating into the material substances and the level of
energy impacts depend on the quality of the protection element from external
and internal operational factors. The growth of intensity of their effect on the flow rate element increases the
physical and chemical processes which occur as a result of reversible and
irreversible changes in the material. The physical nature of failure based on
the practical problem of determining the reliability of discrete devices. It is
necessary to take into account the causes of failures and correct construction of
mathematical models.
For the analysis of the reliability of information and settlement
systems developed mathematical models for reliability theory. Developed and
described the model reflects the behavior of a composite material based on
discrete devices completion of the physical processes in the material itself.
In the analysis of systems such as the metal-nonmetal, metal to metal, there is
a special area - a thin layer having excellent physical - chemical properties
of the main components. This layer is responsible for the strength of the
contact and is the link between material phases. Numerical implementation of
these tasks carried out in accordance with the developed algorithm using
existing mathematical software, with some additions.
Ключевые слова: надежность, деградация, дискретный
устройство, композитный материал, алгоритм, прогнозирование
Keywords: reliability, degradation, discrete
devices, composite, the algorithm prediction
1. Introduction
At the time of computer technology the question of the maximum operation
of computer systems raises. Long life cycle of a computer system should provide
both functional software components and the physical hardware. One of the
conditions is to ensure the physical reliability discrete of devices of
computer systems.
The concept of failure, that is a violation of the discrete device is
the main concept in reliability theory [1 р.25, 2 р.37 ].
The physical nature of failures
is based on the practical problems of determining the reliability of discrete devices. It is necessary to consider
the causes of failures and correct construction of mathematical models [3 р.270]. The discrepancy between the
theoretical model of failures and mathematical model of failures leads to
inconsistency in performance of reliability assessment.
The relevance of this study is that a priori assessment of material
discrete device behavior allows to get reliability of discrete devices of
computer systems at low cost. This in turn will ensure the device manufacturer
of discrete device to guarantee the time of its reliability.
2. The object, goals and objectives of the study
Object of study - materials of discrete devices of computer systems.
The aim of the study is to analyze the causes of circuits degradation
that are made of semiconductors and software reliability of discrete devices of
computer systems.
To achieve this goal it is necessary:
1. to analyze the causes of circuits degradation;
2. to perform classification of methods for assessing reliability;
3. to describe the prediction model of discrete devices reliability.
3. Model of composite
material that reflects the behavior of the material of discrete device
In the analysis of the type 
and 
it was found that in the vicinity of the contact there
is a special region – a thin layer that has different physical - chemical
properties from 
and 
[4]. This layer is responsible for the strength of contact and is
the link between the phases 
and 
(Fig. 1).
Figure 1. Model of contact of two bodies in view of the interface
Chemical reactions at the interface cause chemical reaction. It forms a
new phase, which is dissolved during solidification and leads to the fact that
the interface is different in its physical and mechanical characteristics of
the properties of the solid phase F and solidified matrix M.
As a result of the load on discrete components and device temperature
influences on it will have failures in the device due to improper current flow
in the transitions that will cause failure in the work of the devices and
reduce their reliability. Subsequent studies will be devoted entirely to the
mechanical behavior of structural elements of composite materials based on
constructed model of interaction of components.
The problem of prediction of discrete devices reliability is associated
with the problem of creating materials with predetermined properties: strength,
ductility, resistance to high and low temperatures, conductivity, which
requires the creation of composite materials [5]. Composites at successful
technology can withstand high pressure and extreme temperatures. But for the
captured material there is the question of handling different components of a
composite system with different mechanical loads. Therefore, further research
of physical component of discrete devices should be conducted to better predict
the behavior of materials, which will help to avoid some reason degradation.
4. Summary
According
to this goal, we have:
1.
Completed classification bounce discrete devices.
2. The
analysis of the physics of failures.
3. We describe the model of composite materials, reflecting the behavior
of the material of discrete device together with completed physical processes in the material. Crashes in device work due
to improper current flow in 
transitions will cause failure in the device and reduce their
reliability; the described model enables to estimate the behavior of the
discrete device material that will continue operation of the device.
References:
1.
Gotra
Z.Yu., Nikolaev I.M. (1978) Control of quality and reliability of circuits M .:
Radio and Communications,168p.
2.
Pohrebynskyy
SB, VP Strel'nikov (1988) Design and reliability of computers mykroprotsessornh
. M .: Radio and Communications,167р.
3.
Shore
YB (1962) Statystycheskye analysis methods of quality control and reliability
of [Text]. M .: Sov. Glad.- 552р.
4. Кравченко О. В. Математична модель міжфазової взаємодії в композитах та
уточнення моделі методами обчислювальної математики// Вісник Східноукраїнського
національного університету ім. В. Даля. – Луганськ, 2003. – №7(65). – с.84–88.
5.
Златкін, А. А. Аналіз причин деградації
матеріалів дискретних пристроїв комп’ютерних систем [Текст] / А. А. Златкін, О.
В. Кравченко, О. С. Вовчановський // Технологічний аудит та резерви
виробництва. – 2014. – № 5/3 (19). – С. 37-41.
doi:10.15587/2312-8372.2014.27934